| Rigaku R-AXIS Rapid IP area-detector diffractometer | 2206 independent reflections |
| Radiation source: Rotating Anode | 1870 reflections with I > 2σ(I) |
| Monochromator: graphite | Rint = 0.023 |
| T = 153(2) K | θmax = 25.0º |
| ω Oscillation scans | θmin = 3.2º |
| Absorption correction: multi-scan(ABSCOR; Higashi 1995) | h = −11→11 |
| Tmin = 0.972, Tmax = 0.991 | k = −18→18 |
| 18227 measured reflections | l = −20→20 |
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