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. Author manuscript; available in PMC: 2010 Aug 9.
Published in final edited form as: Adv Funct Mater. 2008 Jul;18(14):2079–2088. doi: 10.1002/adfm.200800105

Figure 1.

Figure 1

a-c: Raw ToF-SIMS negative ion images (each 500 μm × 500 μm) for NHS- and MeO-capped patterned surfaces at m/z 42, 98 and 114, respectively, where bright regions correspond to each fragment map. Image d is the PC-1 scores map of negative ion ToF-SIMS spectra derived from principal component analysis of raw ion images between m/z 1 and 200 (see Figure 2) where bright regions correspond to NHS-correlated ion fragments and dark regions correspond to ions correlated with MeO-capped chemistry.