Skip to main content
. 2001 Jan 30;98(4):1398–1403. doi: 10.1073/pnas.041489198

Table 1.

Electron crystallographic data

Two-side plane group p4212
Unit cell dimension a = b = 99.58 ± 0.50 Å, c = 100 Å
IQ cut-off* of data ≤ 7
Number of observed amplitudes 48,037
Number of observed phases 19,839
Number of structure factors 2,947
Overall completeness (100–3.7 Å) 63%
In-plane resolution 3.7 Å
Estimated resolution normal to the bilayer 6 Å
Overall phase residual 25.7°
Electron diffraction
 Resolution limit 3.3 Å
 Maximum tilt 57.5°
 Number of patterns 44
 RFriedel§ 6.7–28.9% (15.8%)
 Rmerge 15.4–47.3% (27.5%)
Image
 Resolution limit 3.7 Å
 Maximum tilt 60.2°
 Number of images 72
 Phase residual in  resolution zones (100–7.0 Å) 20.0°
(7–4.0 Å) 39.7°
(4.0–3.7 Å) 55.7°
 Overall (100–3.7 Å) 25.7°
Refinement statistics
 Rfactor** 35.0%
 Rfree** 45.1%
 φfree‡‡ 62.4°
*

Nomenclature of Henderson et al. (43). 

With figure of merit ≥ 0.27. Maximum completeness for data up to 60° tilt is 83%. 

Based on calculation of point-spread function (44) for the experimental map. 

§

RFriedel = ∑hk|Ihk − Ih̄k̄|/∑hk(Ihk + Ih̄k̄), average in parentheses. 

Rmerge = ∑hk|Iobs − Ifit|/∑hkIfit, average in parentheses. 

Weighting based on amplitudes. 

**

Using electron diffraction amplitudes (≥ 2σ) between 24 and 3.7 Å. 

‡‡

Averaged difference between phases calculated from the model and the observed phases with figure of merit ≥ 0.50.