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. 2010 Jul 28;84(19):10063–10073. doi: 10.1128/JVI.00898-10

TABLE 1.

Data collection statistics

Parameterb Value for data set
Native Derivative
X-ray source ID 23-2 X13
Space group P41212 P41212
Unit cell parameters (Å) a = b = 62.5, c = 199.4 a = b = 61.1, c = 192.1
Wavelength (Å) 0.873 0.801
Resolution range (Å) 50.0-2.5 50.0-2.6
Highest resolution shell 2.65-2.50 2.76-2.61
Mosaicity 0.18 0.26
Mean I/σ(I) 9.7 (2.0)a 38.3 (10.6)a
Rfac (linear) (%) 16.0 (77.8)a 6.3 (27.3)a
Redundancy 8.3 15.2
Rmeas (%) 17.0 (83.0)a 6.5 (28.4)a
No. of observations 215456 321582
No. of unique reflections 25792 21221
Completeness (%) 99.2 (95.1)a 99.4 (96.5)a
a

Numbers given in parentheses are from the highest resolution shell.

b

Rfac = [ΣhklΣi|Ii(hkl) − <I(hkl)>1)/ΣhklΣIi(hkl)], where Ii(hkl) is the intensity of the ith measurement of reflection (hkl) and <I(hkl)> is the average intensity. Rmeas = (Σhkl[1/N − 1]1/2Σi|Ii(hkl) − <I(hkl)>1)/ΣhklΣIi(hkl), where Ii(hkl) is the intensity of the ith measurement of reflection (hkl), <I(hkl)> is the average intensity, and N is the number of measurements (or redundancy).