Table 3.
Overview of the most important CT-measurement parameters for the various samples and for the various XCT-measurement systems.
Sample/CT-parameter | μXCT | Sub-μXCT | sXCT | |
---|---|---|---|---|
Steel | ||||
Voltage (kV)/beam energy | Scan A | Scan B | ||
91 | 120 | 60 | 30 | |
Voxel size (μm) | 3.5 | 3.5 | 0.5 | 0.3 |
Beam current (μA) | 67 | 55 | 325 | – |
Target | W | W | W | ID19 beamline |
AlSi12Ni1 | ||||
Voltage (kV)/beam energy | 160 | 50 | 29 | |
Voxel size (μm) | 3.5 | 0.4 | 0.3 | |
Beam current (μA) | 25 | 400 | – | |
Target | W | Mo | ID19 beamline | |
AlMg5Si7 | ||||
Voltage (kV)/beam energy | 160 | 50 | 29 | |
Voxel size (μm) | 3.5 | 0.4 | 0.3 | |
Beam current (μA) | 25 | 400 | – | |
Target | W | Mo | ID19 beamline |