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. Author manuscript; available in PMC: 2011 Nov 2.
Published in final edited form as: Langmuir. 2010 Nov 2;26(21):16534–16539. doi: 10.1021/la1013889

Figure 5.

Figure 5

SEM images showing that (a) a missing hinge defect during 2D patterning results in (b) no rotation of the specific panels in the polyhedra. The image scale bar represents a length of 100 nm and the composition / thickness of the films are approximately: Cr 0.2 nm (adhesion promoter), Ni 13 nm, Sn 26 nm.