Fig. 2.

A genome-wide screen for gene knockout-caused variations in tellurium accumulation and tolerance in S. cerevisiae. A genome-wide screen for gene knockout-induced variations in tellurium accumulation and tolerance in S. cerevisiae was carried out. About 4,200 gene knockout mutants of haploid reference strain BY4741 were robotically pinned onto K₂TeO₃ (0.1 or 0.4 mM)-containing solid medium, and colony size and color were recorded after 1, 2, 3, and 6 days of growth. (A) Cellular functions enriched (Fisher's exact test, P < 0.001) among gene knockout mutants with significant aberrations in Te(IV) tolerance and/or tellurium accumulation (colony color) using biological process annotations from MIPS (http://mips.gsf.de/genre/proj/yeast). Heat map colors reflect degrees of enrichment. (B) Gene knockout mutants influencing Te(IV) tolerance and/or tellurium accumulation were confirmed using homozygote diploid knockout mutants in the BY4743 background. Confirmed gene knockout mutants were hierarchically clustered (Pearson correlation coefficients, average-linkage clustering) according to degree of deviation in Te(IV) tolerance and tellurium accumulation in relation to the BY4743 reference strain.