FIG. 1.

Deletion of SRS2 suppresses the sensitivity of rad18Δ cells to CLUV in a recombination-dependent manner. (A) The plating efficiencies for WT, rad18Δ, srs2Δ, and rad18Δ srs2Δ strains during exposure to CLUV irradiation. Asynchronized log-phase cells were grown in YPAD under CLUV irradiation, and samples were taken every 3 h to determine plating efficiency. Cell viability is represented as relative CFU (= 1 at time zero). Data were obtained from at least three independent experiments. Error bars indicate standard deviation. (B) Flow cytometry of WT, rad18Δ, srs2Δ, and rad18Δ srs2Δ cells exposed to CLUV. Asynchronous cells were grown under CLUV, and samples were collected for FACS analysis for DNA content. (C) Spot assays were performed using 10-fold serial dilutions of exponential-phase cultures of the indicated strains. DNA damage was induced by CLUV exposure for 2 days.