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. 2008 Sep 20;64(Pt 10):o1964. doi: 10.1107/S1600536808029474
Enraf–Nonius CAD-4 diffractometer 1422 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.048
graphite θmax = 25.2°, θmin = 1.8°
ω/2θ scans h = −22→20
Absorption correction: ψ scan (North et al., 1968) k = 0→18
Tmin = 0.973, Tmax = 0.982 l = 0→10
2123 measured reflections 3 standard reflections every 200 reflections
2058 independent reflections intensity decay: none