| Rigaku R-AXIS RAPID IP area-detector diffractometer | 4312 independent reflections |
| Radiation source: Rotating Anode | 3531 reflections with I > 2σ(I) |
| graphite | Rint = 0.038 |
| ω oscillation scans | θmax = 27.5°, θmin = 1.5° |
| Absorption correction: multi-scan (ABSCOR; Higashi 1995) | h = −18→18 |
| Tmin = 0.855, Tmax = 0.927 | k = −13→13 |
| 17437 measured reflections | l = −17→17 |
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