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. 2010 Jun 29;28(4):647–651. doi: 10.1116/1.3397736

FIG. 2.

FIG. 2.

(Color online) LDPI-MS instrument schematic with inset showing an expanded view of (a) ionization/extraction region ion optics. (b) is reflectron time-of-flight mass analyzer, (c) is reflectron detector, (d) is vacuum compatible translation stage, (e) is load lock, (f) is 349 nm Nd:YLF desorption laser, (g) is 157 nm fluorine laser for VUV postionization, and (h) is camera for optical imaging of sample.