(Color online) LDPI-MS instrument schematic with inset showing an expanded view of (a)
ionization/extraction region ion optics. (b) is reflectron time-of-flight mass analyzer,
(c) is reflectron detector, (d) is vacuum compatible translation stage, (e) is load lock,
(f) is 349 nm Nd:YLF desorption laser, (g) is 157 nm fluorine laser for VUV
postionization, and (h) is camera for optical imaging of sample.