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. 2010 Oct 11;107(42):18127–18131. doi: 10.1073/pnas.1004880107

Fig. 2.

Fig. 2.

Measuring electrical transport along a bacterial nanowire. (A) Tapping-mode atomic force microscopy (AFM) amplitude image detailing the contact area with the bacterial nanowire from Fig. 1. (B) Contact-mode AFM deflection image of the junction after cutting the nanowire with FIB milling. The arrow marks the cut location. (C) Current-voltage curve of the bacterial nanowire (ramp-up and ramp-down) both before (red) and after (black) cutting the nanowire.