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. Author manuscript; available in PMC: 2011 Jan 1.
Published in final edited form as: IEEE J Sel Top Quantum Electron. 2010;16(3):619–626. doi: 10.1109/JSTQE.2009.2032666

Figure. 1.

Figure. 1

Schematic of LEBS experimental instrument. A broadbaned 450 W Xenon source (S) is imaged onto an aperture of variable size which serves as a secondary source (SS). The size of the aperture is selected by appropriately positioning the aperture wheel. The beam is collimated with lens L2 and passed through polarizer P1. A beam splitter (B) allows collection of backscattered light from the sample. The co-polarized light is selected with polarized P2. Lens L3 then maps the angular distribution of the backscattered light onto the CCD camera detection chip. A liquid crystal tunable filter (LCTF) attached to the camera is used to select the wavelength of collection.