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. Author manuscript; available in PMC: 2012 Jan 1.
Published in final edited form as: Colloids Surf B Biointerfaces. 2010 Sep 28;82(1):173–181. doi: 10.1016/j.colsurfb.2010.08.031

Table 1.

Calculated RMS roughness values of the AFM topography images of control and processed allow substrates after spatial high-pass filtering (cutoff 200 nm).

RMS roughness of sub-200 nm features
Control 4.1 ± 1.1 nm
Heat-treated 12.8 ± 1.7 nm
RFGD-treated 3.6 ± 0.9 nm
a

Values are mean of at least 3 samples for each treatment (mean ± standard deviation).