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. 2010 Sep 30;4(3):032201. doi: 10.1063/1.3488672

Table 1.

Silicon wafer characterization results.

d (SiO) (nm) Hydro- rms (nm) Θawater (deg) Θrwater Θaglycerol (deg) Θa1-bromonaph (deg)
2.0(1) philic 0.09(2) 5(2) Complete wetting 11(3) 13(4)
192(1) philic 0.13(3) 7(2) Complete wetting 17(3) 15(3)
2.0(1) phobic 0.12(2) 111(1) 107(1)° 95(2) 62(4)
192(1) phobic 0.15(2) 112(1) 108(2)° 92(2) 63(3)