Skip to main content
. 2008 Dec 13;65(Pt 1):o95. doi: 10.1107/S1600536808039329
Enraf–Nonius CAD-4 diffractometer 959 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.051
graphite θmax = 25.3°, θmin = 2.4°
ω/2θ scans h = 0→8
Absorption correction: ψ scan (North et al., 1968) k = 0→12
Tmin = 0.339, Tmax = 0.424 l = −20→20
2295 measured reflections 3 standard reflections every 200 reflections
1347 independent reflections intensity decay: 1%