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. 2008 Dec 24;65(Pt 1):o197. doi: 10.1107/S1600536808043201
Enraf–Nonius CAD-4 diffractometer 1067 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.058
graphite θmax = 25.3°, θmin = 1.3°
ω/2θ scans h = 0→7
Absorption correction: ψ scan (North et al., 1968) k = 0→10
Tmin = 0.957, Tmax = 0.985 l = −19→19
1915 measured reflections 3 standard reflections every 200 reflections
1757 independent reflections intensity decay: 1%