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. 2009 Jan 28;65(Pt 2):o403. doi: 10.1107/S1600536809002980
Enraf–Nonius CAD-4 diffractometer 769 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.0000
graphite θmax = 25.3°, θmin = 3.1°
ω/2θ scans h = −8→8
Absorption correction: ψ scan (North et al., 1968) k = 0→8
Tmin = 0.954, Tmax = 0.977 l = 0→14
1123 measured reflections 3 standard reflections every 200 reflections
1123 independent reflections intensity decay: 9%