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. 2009 Jan 8;65(Pt 2):o231. doi: 10.1107/S1600536808043274
Enraf–Nonius CAD-4 diffractometer 1575 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.048
graphite θmax = 25.3°, θmin = 2.4°
ω/2θ scans h = 0→10
Absorption correction: ψ scan (North et al., 1968) k = 0→20
Tmin = 0.914, Tmax = 0.970 l = −10→10
2431 measured reflections 3 standard reflections every 120 min
2274 independent reflections intensity decay: 1%