| Enraf–Nonius CAD-4 diffractometer | 1950 reflections with I > 2σ(I) |
| Radiation source: fine-focus sealed tube | Rint = 0.042 |
| graphite | θmax = 25.3°, θmin = 2.2° |
| ω/2θ scans | h = 0→12 |
| Absorption correction: ψ scan (North et al., 1968) | k = 0→13 |
| Tmin = 0.971, Tmax = 0.981 | l = −19→19 |
| 3458 measured reflections | 3 standard reflections every 200 reflections |
| 3262 independent reflections | intensity decay: 1% |