Skip to main content
. 2009 Feb 21;65(Pt 3):o558. doi: 10.1107/S1600536809005418
Enraf–Nonius CAD-4 diffractometer 1950 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.042
graphite θmax = 25.3°, θmin = 2.2°
ω/2θ scans h = 0→12
Absorption correction: ψ scan (North et al., 1968) k = 0→13
Tmin = 0.971, Tmax = 0.981 l = −19→19
3458 measured reflections 3 standard reflections every 200 reflections
3262 independent reflections intensity decay: 1%