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. 2009 Feb 25;65(Pt 3):m324–m325. doi: 10.1107/S1600536809006047
Rigaku R-AXIS RAPID-S diffractometer 3799 independent reflections
Radiation source: fine-focus sealed tube 3317 reflections with I > 2σ(I)
graphite Rint = 0.071
ω scans θmax = 26.4°, θmin = 2.5°
Absorption correction: multi-scan (ABSCOR; Higashi, 1995) h = −9→9
Tmin = 0.904, Tmax = 0.935 k = −10→10
18356 measured reflections l = −20→20