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. 2009 Mar 25;65(Pt 4):o850. doi: 10.1107/S1600536809009283
Nonius KappaCCD diffractometer 2085 reflections with I > 2σ(I)
Radiation source: rotating anode Rint = 0.049
MONTEL, graded multilayered X-ray optics θmax = 27.5°, θmin = 3.2°
Detector resolution: 9 pixels mm-1 h = −11→11
CCD; rotation images; thick slices scans k = −18→18
7575 measured reflections l = −17→17
3893 independent reflections