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. 2009 Aug 15;65(Pt 9):i68. doi: 10.1107/S1600536809031559
Enraf–Nonius CAD-4 diffractometer 178 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.125
graphite θmax = 34.8°, θmin = 2.5°
θ/2θ scans h = −5→5
Absorption correction: numerical (SHELXTL; Sheldrick, 2008) k = −5→5
Tmin = 0.117, Tmax = 0.718 l = −13→13
1906 measured reflections 3 standard reflections every 120 min
181 independent reflections intensity decay: none