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. 2009 Aug 19;65(Pt 9):m1086. doi: 10.1107/S1600536809032073
Enraf–Nonius CAD-4 diffractometer 3303 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.054
graphite θmax = 25.3°, θmin = 1.5°
ω/2θ scans h = 0→9
Absorption correction: ψ scan (North et al., 1968) k = −14→14
Tmin = 0.693, Tmax = 0.879 l = −17→17
5096 measured reflections 3 standard reflections every 120 min
4734 independent reflections intensity decay: 1%