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. 2009 Nov 18;65(Pt 12):o3108. doi: 10.1107/S1600536809047990
Enraf–Nonius CAD-4 diffractometer 1189 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.018
graphite θmax = 25.3°, θmin = 2.3°
ω/2θ scans h = 0→10
Absorption correction: ψ scan (North et al., 1968) k = 0→10
Tmin = 0.931, Tmax = 0.964 l = −13→13
1670 measured reflections 3 standard reflections every 200 reflections
1568 independent reflections intensity decay: 1%