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. 2009 Nov 28;65(Pt 12):o3224. doi: 10.1107/S1600536809050363
Nonius KappaCCD diffractometer 3136 reflections with I > 2σ(I)
Radiation source: rotating anode Rint = 0.027
MONTEL, graded multilayered X-ray optics θmax = 27.5°, θmin = 3.5°
Detector resolution: 9 pixels mm-1 h = −21→21
CCD; rotation images; thick slices, phi/ω–scan k = −7→6
11675 measured reflections l = −21→20
3499 independent reflections