Figure 2. The number of escaped events (NEE) against log viral load, corrected for the number of synonymous epitopes (NSE).

Number of escape events is a significant predictor of log viral load after the background level of mutation is taken into account (multiple linear regression: p = 0.0021, gradient = 0.11, r² = 0.060, N = 157). The width of each bar is proportional to the number of points. Alternate representations of this data are shown in Figure S2.