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. 2009 Jul 29;65(Pt 8):o2020–o2021. doi: 10.1107/S1600536809029353
Guinier G670 diffractometer Data collection mode: transmission
Radiation source: line-focus sealed tube Scan method: continuous
Curved Germanium (111) min = 5.00°, 2θmax = 75.00°, 2θstep = 0.01°
Specimen mounting: thin layer in the specimen holder of the camera