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. 2009 Jul 4;65(Pt 8):o1775. doi: 10.1107/S1600536809025410
Enraf–Nonius CAD-4 diffractometer 1292 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.031
graphite θmax = 25.3°, θmin = 2.0°
ω/2θ scans h = 0→7
Absorption correction: ψ scan (North et al., 1968) k = −7→8
Tmin = 0.969, Tmax = 0.990 l = −12→12
1756 measured reflections 3 standard reflections every 120 min
1606 independent reflections intensity decay: 1%