| Enraf–Nonius CAD-4 diffractometer | 1388 reflections with I > 2σ(I) |
| Radiation source: fine-focus sealed tube | Rint = 0.0000 |
| graphite | θmax = 25.0°, θmin = 1.5° |
| ω/2θ scans | h = −34→33 |
| Absorption correction: ψ scan (XCAD4; Harms & Wocadlo, 1995) | k = 0→4 |
| Tmin = 0.976, Tmax = 0.992 | l = 0→14 |
| 2351 measured reflections | 3 standard reflections every 200 reflections |
| 2351 independent reflections | intensity decay: none |
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