Rigaku R-AXIS RAPID IP area-detector diffractometer	4478 independent reflections
Radiation source: rotating anode	4051 reflections with I > 2σ(I)
graphite	Rint = 0.044
ω scans at fixed χ = 45°	θmax = 68.2°, θmin = 3.3°
Absorption correction: multi-scan (ABSCOR; Higashi, 1995)	h = −10→10
Tmin = 0.687, Tmax = 0.882	k = −11→12
17108 measured reflections	l = −32→32