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. 2010 Aug 26;62(1):351–358. doi: 10.1093/jxb/erq276

Fig. 4.

Fig. 4.

Relationships between the lumped model parameters, i.e. interfacial capacitances (A) and superposition resistance and interfacial root resistance (B), with the contact area of stem and root with the solution of willows in three experimental set-ups: ‘Stem and root’ (filled squares, circles, and triangles), ‘Root’ (open triangle), and ‘Stem’ (open squares and circles) (see Fig. 1, 2). Squares, circles, and triangles refer to the longitudinal (Css and Rsup) and cross-sectional interface (Csc and Rsup) of stem and to the interface of roots (Cr, Rr, and Rsup) with the solution, respectively. The detailed regression results can be seen in Table 2.