Fig. 4.

Identification of interacting charge patches by filament assembly rescue. (A, C, and D) Quantification of filament solubility of tail fragments containing sets of complementary mutations. Error bars represent SD from three independent measurements. (B) Electron micrographs of two populations of negatively stained tail fragment (1550–2011) assemblies containing a pair of complementary mutations. Double-mutant filaments were less stable than their wild-type counterparts, which necessitated the use of less stain, accounting for the lower contrast in these images.