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. Author manuscript; available in PMC: 2012 Feb 23.
Published in final edited form as: Microsc Res Tech. 2010 Aug 23;74(4):377–388. doi: 10.1002/jemt.20919

Figure 2.

Figure 2

(a) Frequency in the dark current of the detector. The lines are the simulation for different integration time of a 194.2 KHz signal. The dots are the frequencies calculated from the dark current. (b) Normalized mean value of the dark current (offset). (C) Amplitude variation of the signal around the mean value.