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. Author manuscript; available in PMC: 2012 Feb 23.
Published in final edited form as: Microsc Res Tech. 2010 Aug 23;74(4):377–388. doi: 10.1002/jemt.20919

Figure 9.

Figure 9

Variation of the analog detector parameters as a function of time for a pixel dwell time of 10.04 µs and a gain of 8.4. Variation of the offset digital levels (a), of the digital level distribution (S) for consecutive measurements (b) and of the readout noise of the detector (c) for consecutive measurements. Variation of the same parameters with 10 minutes between the measurements and effect of the temperature on the offset (e), distribution of digital levels (f) and readout noise (g). The up arrow indicates the time at which the room temperature was increased to 26 °C, while the down arrow indicates the time when the temperature was turned back to 20°C.