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. 2010 Nov 30;66(Pt 12):o3359. doi: 10.1107/S1600536810049147
Enraf–Nonius CAD-4 diffractometer 984 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.023
graphite θmax = 25.4°, θmin = 2.4°
ω/2θ scans h = 0→9
Absorption correction: ψ scan (North et al., 1968) k = 0→12
Tmin = 0.977, Tmax = 0.992 l = −17→17
2387 measured reflections 3 standard reflections every 200 reflections
1241 independent reflections intensity decay: 1%