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. Author manuscript; available in PMC: 2011 Jan 11.
Published in final edited form as: Nanotechnology. 2010 Aug 12;21(36):365302. doi: 10.1088/0957-4484/21/36/365302

Figure 3.

Figure 3

Etched tip SEM images for the commercial Pt coated tip with 150 nm-thick SiO2 film deposited by PECVD taken from the (a) top and (b) 45° tilted view, and for the commercial Pt coated tip with 30 nm-thick SiO2 film deposited by sputtering taken from the (c) top and (d) 45° tilted view.