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. Author manuscript; available in PMC: 2011 Jan 11.
Published in final edited form as: Nanotechnology. 2010 Aug 12;21(36):365302. doi: 10.1088/0957-4484/21/36/365302

Figure 7.

Figure 7

(a) Tapping mode AFM image of the standard grid of sharp spikes (Inset: three-dimensional representation of tip shape). (b) Topography line profile (green line in figure 9 (a)) and PFM phase line profile (red line in figure 10). Tip radius obtained from topography profile (~ 30 nm) corresponds well with tip radius (32 nm) obtained from PFM phase fitting.