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. Author manuscript; available in PMC: 2011 Sep 20.
Published in final edited form as: Small. 2010 Sep 20;6(18):2026–2034. doi: 10.1002/smll.201000825

Figure 2.

Figure 2

X-ray diffraction of oxide-embedded, hydride-terminated, and dodecene-passivated Si nanocrystals. Dodecene and Si powder references show the expected peak positions of the surface alkyl layer and diamond cubic Si (PDF # 027-1402, a = b = c = 5.43088 Å), respectively. Data are normalized to the (111) peak intensity and shifted vertically for clarity.