Fig. 6.
Observed bubble formation versus radiant exposure at 532 nm (triangles) and fit of a logistic distribution (solid line), 50% occurrence probability at 60 ± 4 mJ/cm2.
Observed bubble formation versus radiant exposure at 532 nm (triangles) and fit of a logistic distribution (solid line), 50% occurrence probability at 60 ± 4 mJ/cm2.