Figure 3.

Electron-based measurements can be used to quantify both regular lattice structures and defects. (a,b) STM is used to quantify packing density and structure of two different halogenated phenols on a Cu{111} surface. Both regular structure and defects are evident in both frames. (c) TEM image and Fourier transform of a nanocrystal superlattice composed of PbS and Pd particles. Again, direct imaging allows defects to be observed in addition to lattice structure. (d) TEM image of a one-dimensional lattice of endohedral lanthanide fullerenes in a single-walled carbon nanotube. Inset shows positions of individual lanthanide atoms within fullerenes. Note that while TEM typically measures longer length scales than STM (observe difference in scale bars between (a−b) and (c)), it is also possible to measure shorter length scales similar to STM (note similar scale bars in (a−b) and (d)). Adapted from refs (58), (59), and (66).