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. 2010 Dec 22;1:163–171. doi: 10.3762/bjnano.1.20

Figure 5.

Figure 5

The counter-surface is held by two small beams. After the experiments, the beams can be broken and the counter-surface flipped upright in its hinges with a probe needle, allowing easy access with an AFM cantilever tip. The AFM has been used to measure the surface roughness (Figure 6) on the sidewall at the position where the arrow indicating ‘Counter-surface’ is pointing.