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. 2010 Nov 22;1:24–47. doi: 10.3762/bjnano.1.5

Figure 7.

Figure 7

TEM images of 3 nm FePt NPs on Si/SiO2 after annealing at 650 °C for 90 min. (a) Bright-field TEM image of FePt nanoparticles in cross section view. The NPs are in situ covered by a thin layer (10 nm) of SiO2 to avoid oxidation and mechanical damage after annealing. (b) Bright-field TEM image of FePt NPs in plane view. The hexagonal ordering can be clearly seen.