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. 2010 Dec 21;286(8):6751–6759. doi: 10.1074/jbc.M110.198408

FIGURE 3.

FIGURE 3.

Effects of UbKO expression on WT or S624T mutant hERG expression levels in stable cell lines cultured in 5 or 0 mm K+ MEM. A, hERG expression levels in control (Ctl) or UbKO-transfected hERG-HEK cells cultured in 0 mm K+ MEM for various periods. B, relative density of the 155-kDa hERG band in cells at various periods of culture in 0 mm K+ MEM. The intensity of the 155-kDa band at each time point was normalized to the initial value and plotted against time (n = 5). C, families of IhERG in control (Ctl) or UbKO-transfected hERG-HEK cells cultured in 0 mm K+ MEM for 0, 2, or 4 h. D, the time courses of 0 mm K+ exposure-induced reduction of IhERG in control (Ctl) or UbKO-transfected hERG-HEK cells. E, the hERG expression level in control (Ctl) or UbKO-transfected hERG-HEK cells cultured in 5 mm K+ MEM for 48 h. F, the S624T hERG expression levels in a stable cell line without or with UbKO transfection cultured in 5 or 0 mm K+ MEM for 6 h. In B and D, Error bars represent standard error of the mean. * denotes p < 0.05, and ** denotes p < 0.01 compared with the respective controls (Ctl).