Figure 10.

SAXS from DOPE/DOPC (8:2, mol/mol) at different temperatures. Intensities are plotted as a function of q = 4π sin θ/λ, where λ is the wavelength of the X-ray and θ is half the angle between the incident and diffracted beams. Curves are offset from a common baseline for clarity of presentation. Labels indicate diffraction from lamellar structures (L), which occurs at values of q with ratios of 1:2:..., and from hexagonal structures (H_II) at 1:(3)^1/2:2:...