Table 1.
Manufacturer and exposure index parameters used for digital radiography systems
Manufacturer | Exposure indicator name | Symbol | Units | Exposure dependence, X | Detector calibration conditions |
---|---|---|---|---|---|
Fujifilm | S value | S | Unitless | 200/S ∝ X (mR) | 80 kVp, 3 mm Al “total filtration” S = 200 @ 1 mR |
Carestream | Exposure index | EI | Mbels | EI + 300 = 2X | 80 kVp, 1.0 mm Al + 0.5 mm Cu; EI = 2000 @ 1 mR |
Agfa | Log of median of histogram | lgM | Bels | lgM + 0.3 = 2X | 400 speed class, 75 kVp + 1.5 mm Cu; lgM = 1.96 @ 2.5 μGy |
Konica | Sensitivity number | S | Unitless | For QR = k, 200/S ∝ X(mR) | QR = 200, 80 kVp, S = 200 @ 1 mR |
Canon | Reached exposure value | REX | Unitless | Brightness = c1, Contrast = c2, REX ∝ X1 | Brightness = 16 |
Contrast = 10 | |||||
REX ≈ 106 @ 1 mR1 | |||||
Canon | EXP | EXP | Unitless | EXP ∝ X | 80 kVp, 26 mm Al, HVL = 8.2 mm Al, DFEI = 1.5 |
EXP = 2000 @ 1 mR | |||||
GE | Uncompensated detector exposure | UDExp | μGy air kerma | UDExp ∝ X (μGy) | 80 kVp, standard filtration, no grid |
GE | Compensated detector exposure | CDExp | μGy air kerma | CDExp ∝ X (μGy) | Not available |
GE | Detector exposure index | DEI | Unitless | DEI ≈ratio of actual exposure to expected exposure scaled by technique and system parameters. Expected exposure values can be edited by user as preferences. | Not available |
Swissray | Dose indicator | DI | Unitless | Not available | Not available |
Imaging Dynamics | Accutech | F# | Unitless | 2f# = X(mR)/Xtgt(mR) | 80 kVp + 1 mm Cu |
Philips | Exposure index | EI | Unitless | 1000/X (μGy) | RQA5, 70 kV, + 21 mm Al, HVL = 7.1 mm Al |
Siemens | Exposure index | EXI | μGy air kerma | X(μGy) = EI/100 | RQA5, 70 kV + 0.6 mm Cu, HVL = 6.8 mm Al |
Alara CR | Exposure indicator value | EIV | Mbels | EIV + 300 = 2X | 1 mR at RQA5, 70 kV, + 21 mm Al, HVL = 7.1 mm Al = > EIV = 2000 |
iCRco | Exposure index | None | Unitless | Exposure index ∝ log[X (mR)] | 1 mR @ 80 kVp + 1.5 mm Cu => 0 |