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. 2011 Apr 14;41(5):573–581. doi: 10.1007/s00247-010-1954-6

Table 1.

Manufacturer and exposure index parameters used for digital radiography systems

Manufacturer Exposure indicator name Symbol Units Exposure dependence, X Detector calibration conditions
Fujifilm S value S Unitless 200/S ∝ X (mR) 80 kVp, 3 mm Al “total filtration” S = 200 @ 1 mR
Carestream Exposure index EI Mbels EI + 300 = 2X 80 kVp, 1.0 mm Al + 0.5 mm Cu; EI = 2000 @ 1 mR
Agfa Log of median of histogram lgM Bels lgM + 0.3 = 2X 400 speed class, 75 kVp + 1.5 mm Cu; lgM = 1.96 @ 2.5 μGy
Konica Sensitivity number S Unitless For QR = k, 200/S ∝ X(mR) QR = 200, 80 kVp, S = 200 @ 1 mR
Canon Reached exposure value REX Unitless Brightness = c1, Contrast = c2, REX ∝ X1 Brightness = 16
Contrast = 10
REX ≈ 106 @ 1 mR1
Canon EXP EXP Unitless EXP ∝ X 80 kVp, 26 mm Al, HVL = 8.2 mm Al, DFEI = 1.5
EXP = 2000 @ 1 mR
GE Uncompensated detector exposure UDExp μGy air kerma UDExp ∝ X (μGy) 80 kVp, standard filtration, no grid
GE Compensated detector exposure CDExp μGy air kerma CDExp ∝ X (μGy) Not available
GE Detector exposure index DEI Unitless DEI ≈ratio of actual exposure to expected exposure scaled by technique and system parameters. Expected exposure values can be edited by user as preferences. Not available
Swissray Dose indicator DI Unitless Not available Not available
Imaging Dynamics Accutech F# Unitless 2f# = X(mR)/Xtgt(mR) 80 kVp + 1 mm Cu
Philips Exposure index EI Unitless 1000/X (μGy) RQA5, 70 kV, + 21 mm Al, HVL = 7.1 mm Al
Siemens Exposure index EXI μGy air kerma X(μGy) = EI/100 RQA5, 70 kV + 0.6 mm Cu, HVL = 6.8 mm Al
Alara CR Exposure indicator value EIV Mbels EIV + 300 = 2X 1 mR at RQA5, 70 kV, + 21 mm Al, HVL = 7.1 mm Al = > EIV = 2000
iCRco Exposure index None Unitless Exposure index ∝ log[X (mR)] 1 mR @ 80 kVp + 1.5 mm Cu => 0