Fig. 2.

Images and diffraction patterns, static and time-resolved. (A) and (B) Static diffraction patterns for two orientations: (A) θ = 0° and (B) θ = 25°. The pattern in (A) is taken along the [001] zone axis and the one in (B) is taken along the [-201] zone axis. The (120) reflection in (A) is sensitive to the interchain separation and chain conformation in the ab-basal plane and the (112) reflection in (B) is sensitive to changes also in the c-axis. (C) and (D) Time-resolved DF images and corresponding diffraction patterns shown for three representative frames at -200 ns, 400 ns, and 100 ms; the full time dependence is given in Fig 3. In the diffraction the electron beam diameter is 4 μm. The DF images were obtained by selecting with an objective aperture the (120) reflection. The bright lines are due to structures diffracting in Bragg conditions.