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. 2010 Dec 23;67(Pt 1):111–113. doi: 10.1107/S1744309110046981

Table 1. Diffraction data statistics.

Values in parentheses are for the highest resolution shell.

X-ray source Rigaku MicroMax-007 HF
Detector R-AXIS IV++
Wavelength (Å) 1.5418
Temperature (K) 130
Sample-to-detector distance (mm) 300
Rotation per image (°) 1
Total rotation (°) 180
Exposure time (s) 120
No. of crystals 1
Space group P212121
Unit-cell parameters (Å) a = 95.51, b = 104.60, c = 105.40
Resolution range (Å) 25–3.5 (3.69–3.50)
Wilson B factor (Å2) 37
Mosaicity (°) 0.22
Total No. of measurements 98832 (14470)
No. of unique reflections 13826 (1977)
Multiplicity 7.1 (7.3)
Completeness (%) 100 (100)
Rmerge 0.173 (0.338)

R merge = Inline graphic Inline graphic, where Ii(hkl) is the observed intensity and 〈I(hkl)〉 is the average intensity obtained from multiple observations of symmetry-related reflections after rejections.