Fig. 4.
The comparison of MC simulated scatter contribution with that estimated by SSS (Single Scatter Simulation): a) II, SI and SS detector coincidences 2D matrixes (pseudo-sinograms) for scatter events estimated by SSS; b) and c) the profiles extracted from detector coincidences matrix of scatter events. Blue lines (2) are profiles extracted from (a) above. Black lines (1) are the profiles extracted from the MC simulations. The IDinRing of the crystals used to extract the profiles are specified in the plots.